SiSiC Silicon Carbide Pin Chuck Ring Groove Chuck Wafer Chuck Lithographic Photomask Metrology
SiSiC Silicon Carbide Pin Chuck Ring Groove Chuck Wafer Chuck Lithographic Photomask Metrology
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SiSiC Silicon Carbide Pin Chuck Ring Groove Chuck Wafer Chuck Lithographic Photomask Metrology


Canon, ASML, Nikon, KLA, Bruker ,AMAT..


Metrology Lithography Photography AOI Bonding/Debonding etc


Ultra Precision Semiconductor Application


Global flatness 12 Inch : <1um


Local flatness: <20nm (25x25mm)


Modification, duplication ,recondition


Semiconductor Metrology inspection and lithography



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